White light interferometer for stable thickness measurement with submicrometer accuracy
Item number: IMS5400-TH Applications Smart FactoryMechanical engineering & Plant constructionMetal industrySemiconductor industry
Price on request
Delivery time:Delivery time on request
The IMS5400-TH white-light interferometer is used for high-precision thickness measurements from a relatively large distance. A decisive advantage here is the distance-independent measurement, in which a nanometer-accurate thickness value is achieved even with moving objects. The large thickness measuring range enables the measurement of thin layers, flat glass and foils. Since the white light interferometer operates with a SLED in the near-infrared range, thickness measurement of anti-reflective coated glass is also possible.
Micro-Epsilon Messtechnik GmbH & Co. KG
Königbacher Straße 15
94496 Ortenburg
Germany
94496 Ortenburg
Germany
+49 8542 168 0
+49 8542 168 90
Product videos
Attributes of White light interferometer for stable thickness measurement with submicrometer accuracy
May differ from supplier data
Basic data
Resolution 5,000,000,000 nm
Light color / illuminant White light
Product environmental influences (protection class/temperature)
Operating temperature range 5 to 50 °C
Signal inputs/outputs and interfaces
Interfaces Analog Control, Digital Interface, Computer Interface
Approvals / Certificates / Performance level / Integrity level
Certificates/approvals/test marks CE, UKCA
Micro-Epsilon Messtechnik GmbH & Co. KG
Königbacher Straße 15
94496 Ortenburg
Germany
94496 Ortenburg
Germany
+49 8542 168 0
+49 8542 168 90